Base band processor for IEEE 802.11a standard with embedded BIST
نویسندگان
چکیده
منابع مشابه
Scan-Based BIST Diagnosis Using an Embedded Processor
For system-on-chip designs that contain an embedded processor, this paper present a software based diagnosis scheme that can make use of the processor to aid in diagnosis in a scan-based built-in self-test (BIST) environment. The diagnosis scheme can be used to determine both the scan cells that capture errors as well as the failing test vectors during a BIST session thereby allowing a faster a...
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Introduction In the virtual component (VC) integration business, the embedded DRAM is a key VC to realize high bit density and high bandwidth performance, thus the low-cost testing of DRAM-integrated LSI is an emerged problem. The DRAM test usually includes a fail-bit (address) search to repair the memory cell defects with redundancy, requiring long time for wafer probing. A DRAM BIST drastical...
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ژورنال
عنوان ژورنال: Facta universitatis - series: Electronics and Energetics
سال: 2004
ISSN: 0353-3670,2217-5997
DOI: 10.2298/fuee0402231k